X-ray Diffraction
X-ray Diffraction (XRD) is a technique to determine the atomic and molecular structure of a crystal based on Bragg diffraction. X-rays are commonly used to produce the diffraction pattern because their wavelength is typically the same order of magnitude (1–100 angstroms) as the spacing d between planes in the crystal. The information on the intensity and angle of the diffractive X-rays can produce a 3D picture of the density of electrons within the crystal, which leads to the mean positions of atoms as well as chemical bonds, disorders, and other information. If it’s a single crystal sample, it’s usually mounted on a goniometer, which can position the sample at selected orientations. The benefits of the low-temperature XRD are to reduce the radiation damage and thermal motion. Low-temperature XRD also helps characterize superconductor materials.
Customer References:
Beatriz Moreno, Canadian Light Source, University of Saskatchewan, Canada: J. Phys. Chem. C, 125, 48, 26892–26900 (2021).
Diego Casa, Advanced Photon Source, Argonne National Laboratory, USA: Sci Rep 9, 4263 (2019).
Michael Probert, Department of Chemistry, Durham University, England: J. Appl. Cryst. 43, 1415–1418 (2010).
Related Cryostats:
X-2 X-Ray Diffraction
Provides the tight rotational clearance needed when integrating with Huber goniometers and Bruker diffractometers
| Cryostat Model | Type |
|---|---|
| DMX-2 | CCR |