Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) is one of the most versatile instruments for the examination of the surface topography and composition of the sample. The surface images result from the interaction of a focused electron beam with atoms in the sample, which can achieve < 1 nm resolution. Signals generated during the interaction include secondary electrons (SE), back-scattered electrons (BSE), characteristic X-ray and cathodoluminescence, absorbed current, and transmitted electrons. SE is the most standard signal that SEM detects. It has low energies, which leads to a higher resolution. BSE occurs in deeper places within the sample and strongly relates to the atomic number. It is very often used for composition analysis along with characteristic X-ray spectra. Many SEM measurements are conducted when the sample stage is cooled down to cryogenic temperatures based on different sample properties.
Related Cryostats:
X-20B ULV for UHV
Ultra low vibrations and ultra high vacuum
System can be baked out to 200 C
| Cryostat Model | Type |
|---|---|
| CS202-DMX-20B | CCR |
| CS204-DMX-20B | CCR |
| CS210-GMX-20B | CCR |
LT3
Atomic resolution is achieved through a series of matrix heat exchangers
Coaxial shield flow transfer line ensures liquid at the tip and efficient flow
LT4
All-purpose, low cost flow cryostat
Maintains the high cooling power of the LT3
UHV option available
| Cryostat Model | Type |
|---|---|
| LT4 | Flow |